The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Sep. 27, 2013
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Masoud Sajadieh, Fremont, CA (US);
Hooman Shirani-Mehr, Portland, OR (US);
Assignee:
INTEL CORPORATION, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/02 (2006.01); H04L 1/02 (2006.01); H04B 7/04 (2006.01); H04L 5/00 (2006.01); H04B 1/56 (2006.01); H04W 56/00 (2009.01); H04W 76/02 (2009.01); H04W 36/30 (2009.01); H04W 24/00 (2009.01); H04W 36/26 (2009.01); H04W 48/18 (2009.01); H04W 24/10 (2009.01); H04W 36/00 (2009.01); H04W 36/22 (2009.01); H04L 1/18 (2006.01); H04W 48/16 (2009.01); H04W 36/08 (2009.01); H04W 48/12 (2009.01); H04W 88/08 (2009.01);
U.S. Cl.
CPC ...
H04B 7/0456 (2013.01); H04B 1/56 (2013.01); H04B 7/0417 (2013.01); H04L 1/1864 (2013.01); H04L 5/0048 (2013.01); H04L 5/0051 (2013.01); H04L 5/0057 (2013.01); H04L 5/0073 (2013.01); H04L 5/0085 (2013.01); H04W 24/00 (2013.01); H04W 24/10 (2013.01); H04W 36/0005 (2013.01); H04W 36/22 (2013.01); H04W 36/26 (2013.01); H04W 36/30 (2013.01); H04W 48/18 (2013.01); H04W 56/001 (2013.01); H04W 76/023 (2013.01); H04L 5/0007 (2013.01); H04W 36/08 (2013.01); H04W 48/12 (2013.01); H04W 48/16 (2013.01); H04W 88/08 (2013.01); Y02B 60/50 (2013.01);
Abstract
Examples are disclosed for beamforming to mitigate multi-user leakage and interference. The examples include an evolved node B (eNB) receiving feedback from user equipment (UEs) to indicate strongest or highest channel gains for various beams included in a plurality of beam sets. A selection process or scheme may then be implemented to select individual beams for a UE that minimizes or reduces leakage caused by the UE's use of a given beam. Reducing leakage may reduce interference to other UEs using other beams. Other examples are described and claimed.