The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Feb. 18, 2014
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Toshihiro Doi, Naka-gun, JP;

Hideaki Sakurai, Naka-gun, JP;

Nobuyuki Soyama, Naka-gun, JP;

Takashi Noguchi, Akita, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/06 (2006.01); H01G 4/08 (2006.01); H01G 4/018 (2006.01); H01G 4/30 (2006.01); C23C 16/40 (2006.01); H01L 21/02 (2006.01); H01L 49/02 (2006.01); B05D 1/38 (2006.01); B05D 3/02 (2006.01);
U.S. Cl.
CPC ...
H01G 4/08 (2013.01); B05D 1/38 (2013.01); B05D 3/0254 (2013.01); C23C 16/409 (2013.01); H01G 4/018 (2013.01); H01G 4/06 (2013.01); H01G 4/30 (2013.01); H01L 21/02197 (2013.01); H01L 21/02282 (2013.01); H01L 21/02356 (2013.01); H01L 28/55 (2013.01);
Abstract

A PZT-based ferroelectric thin film is formed by coating a PZT-based ferroelectric thin film-forming composition on a lower electrode of a substrate one or two or more times, pre-baking the composition, and baking the composition to be crystallized, and this thin film includes PZT-based particles having an average particle size in a range of 500 nm to 3000 nm when measured on a surface of the thin film, in which heterogeneous fine particles having an average particle size of 20 nm or less, which are different from the PZT-based particles, are precipitated on a part or all of the grain boundaries on the surface of the thin film.


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