The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2016
Filed:
Nov. 11, 2013
Advantest Corporation, Tokyo, JP;
Hanh Lai, Sunnyvale, CA (US);
Edmundo DeLaPuente, Cupertino, CA (US);
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A method for testing memory devices under test (DUTs) using automated test equipment (ATE) is presented. The method comprises retrieving a portion of raw test data from a memory device under test (DUT). It also comprises comparing the portion of raw test data with expected test data to determine failure information, wherein the failure information comprises information regarding failing bits generated by the memory DUT. Next, the method comprises utilizing paging to transfer data comprising the failure information to a filtering module and filtering out the failure information from transferred data using the filtering module. Further, it comprises updating a fail list using the failure information, wherein the fail list comprises address information for respective failing bits within the memory DUT. Finally, it comprises repeating all the prior steps for the next block of raw test data.