The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Nov. 11, 2014
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Ken Jianhui Hu, San Jose, CA (US);

Nian Niles Yang, Mountain View, CA (US);

Bhuvan Khurana, Milpitas, CA (US);

Lee M. Gavens, Milpitas, CA (US);

Kulachet Tanpairoj, Santa Clara, CA (US);

Assignee:

SANDISK TECHNOLOGIES INC., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 11/56 (2006.01); G11C 16/10 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 11/5642 (2013.01); G11C 11/5628 (2013.01); G11C 16/10 (2013.01); G11C 16/26 (2013.01);
Abstract

A data storage device that includes a controller and a non-volatile memory may perform a method that includes comparing, in the controller, first parameter values of a first group of parameter values to second parameter values of a second group of parameter values. The second parameter values of the second group of parameter values are associated with a scheduled non-volatile memory operation. The first parameter values correspond to parameter values that are in the non-volatile memory. The method includes sending, from the controller to the non-volatile memory, a parameter value of the second group in response to determining that the parameter value differs from a corresponding parameter value of the first group.


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