The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2016

Filed:

Dec. 19, 2014
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Navin Agarwal, Kolkata, IN;

Igor Arsovski, Williston, VT (US);

Venkatraghavan Bringivijayaraghavan, Cheyyar, IN;

Krishnan S. Rengarajan, Bangalore, IN;

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 11/419 (2006.01); G11C 7/10 (2006.01); G11C 7/04 (2006.01); G11C 11/4096 (2006.01); G11C 7/22 (2006.01);
U.S. Cl.
CPC ...
G11C 11/419 (2013.01); G11C 7/04 (2013.01); G11C 7/109 (2013.01); G11C 7/1051 (2013.01); G11C 7/22 (2013.01); G11C 11/4096 (2013.01);
Abstract

A memory device with an age-detect-and-correct (ADAC) circuit that detects skew caused by bias temperature instability fatigue (that is, bias temperature instability stress accumulated over time), and counters skew by selectively adjusting the proportion (measured temporally) of active state operation to idle state operation. Also, a memory burn-in device using a similar ADAC circuit.


Find Patent Forward Citations

Agarwal, Navin. (2016). Bias temperature instability state detection and correction (U.S. Patent No. 9251890). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9251890

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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