The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Dec. 12, 2012
Jianbo Shi, Philadelphia, PA (US);
Daniel C. Middleton, Independence, MN (US);
Jianbo Shi, Philadelphia, PA (US);
Daniel C. Middleton, Independence, MN (US);
INTEL CORPORATION, Santa Clara, CA (US);
Abstract
Various embodiments are generally directed to repeated use of wavelet filters with different directional orientations each time to detect distances to edges in different directions in deriving a disparity map from multiple image bitmaps. A method includes subjecting an image bitmap to a first-order wavelet filter a selected number of times, an orientation of the first-order wavelet filter altered each time to create a first set of intermediate maps; and subjecting the first image bitmap to a second-order wavelet filter the selected number of times, an orientation of the second-order wavelet filter altered each time to create a second set of intermediate maps; the first-order and second-order wavelet filters, as well as their orientations, selected to be mathematically related such that the first-order wavelet filter approximates a sine function and the second-order wavelet filter approximates a related cosine function, both masked by a Gaussian. Other embodiments are described and claimed.