The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Jul. 11, 2014
Advantest Corporation, Tokyo, JP;
Hideo Hara, Miyagi, JP;
Shin Masuda, Miyagi, JP;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A test apparatus that easily tests a device under test having an optical interface. Provided is a test method, a test apparatus, and a device interface apparatus on which is mounted a device under test having an optical interface, the device interface apparatus comprising a device mounting section on which the device under test is mounted; an optical connector that is connected to the optical interface of the device under test; and an optical signal detecting section that detects an optical signal output from at least one of the optical interface and the optical connector, before the optical interface of the device under test mounted on the device mounting section is connected to the optical connector.