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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9245808 B1

PDFFull Text
Date of Patent:
Jan. 26, 2016

Filed:

Dec. 19, 2013

Method and system for in-line real-time measurements of layers of multilayered front contacts of photovoltaic devices and calculation of opto-electronic properties and layer thicknesses thereof

Applicant:

First Solar, Inc, Perrysburg, OH (US);

Inventors:

Benyamin Buller, Sylvania, OH (US);

Douglas Dauson, Perrysburg, OH (US);

David Hwang, Perrysburg, OH (US);

Scott Mills, Perrysburg, OH (US);

Dale Roberts, Holland, MI (US);

Rui Shao, Sylvania, OH (US);

Zhibo Zhao, Novi, MI (US);

Assignee:

FIRST SOLAR, INC., Perrysburg, OH (US);

Attorney:

Dickstein Shapiro LLP

Primary Examiner:

Kevin M Picardat

Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/66 (2006.01); G01B 11/06 (2006.01); H01L 31/0224 (2006.01); H01L 31/18 (2006.01); G01R 31/40 (2014.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); G01B 11/0625 (2013.01); H01L 31/022425 (2013.01); H01L 31/022466 (2013.01); H01L 31/1884 (2013.01); H02S 50/00 (2013.01); Y02E 10/50 (2013.01);
Abstract

A method and system for real-time, in-line calculations of opto-electronic properties and thickness of the layers of multi-layered transparent conductive oxide stacks of photovoltaic devices is provided. The method and system include taking measurements of each layer of the stack during deposition thereof. The measurements are then used to calculate the opto-electronic properties and thicknesses of the layers in real-time.

Find Patent Forward Citations

Buller, Benyamin. (2016). Method and system for in-line real-time measurements of layers of multilayered front contacts of photovoltaic devices and calculation of opto-electronic properties and layer thicknesses thereof (U.S. Patent No. 9245808). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9245808

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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