The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2016

Filed:

Apr. 10, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Eitan D Farchi, Pardes Hana, IL;

Howard Hess, Winnetka, IL (US);

Itai Segall, Tel-Aviv, IL;

Rachel Tzoref-Brill, Haifa, IL;

Aviad Zlotnick, Mitzpeh Netofah, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3676 (2013.01); G06F 11/3604 (2013.01); G06F 17/30607 (2013.01); G06F 17/30504 (2013.01); G06F 17/30569 (2013.01); G06F 17/30595 (2013.01); G06F 17/30914 (2013.01);
Abstract

A method for modeling a test space is provided. The method comprises defining a coverage model including one or more attributes, wherein respective values for the attributes are assigned, one or more definitions of value properties for said attributes with assigned values, and one or more requirements that limit combination of attribute values that are legal for the model, wherein at least one of said requirements is defined using at least one value property.


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