The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Apr. 10, 2012
Hyang-sook Chun, Seoul, KR;
Sung-wook Choi, Suwon, KR;
Hyun-joo Chang, Seoul, KR;
Na-ri Lee, Seoul, KR;
Gyeong-sik OK, Osan, KR;
Hyang-Sook Chun, Seoul, KR;
Sung-Wook Choi, Suwon, KR;
Hyun-Joo Chang, Seoul, KR;
Na-Ri Lee, Seoul, KR;
Gyeong-Sik Ok, Osan, KR;
KOREA FOOD RESEARCH INSTITUTE, Seongnam-si, KR;
Abstract
An object inspection apparatus includes a terahertz wave supplying unit for generating a terahertz wave and moving a path of the terahertz wave according to time so that the terahertz wave is supplied to an object to be inspected, a focusing lens located between the terahertz wave supplying unit and the object to be inspected to focus the terahertz wave supplied by the terahertz wave supplying unit, a rotating plate having a plate shape and including a plurality of the focusing lenses with different distances from the center thereof, the rotating plate rotating in the circumferential direction so that one of the focusing lenses is located at a path of the terahertz wave according to the path movement of the terahertz wave, and a terahertz wave detecting unit for collecting and detecting a terahertz wave incident to the object to be inspected.