The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Aug. 24, 2010
Applicants:

Masanori Sakai, Takaoka, JP;

Yukinao Kaga, Toyama, JP;

Takashi Yokogawa, Toyama, JP;

Tatsuyuki Saito, Toyama, JP;

Inventors:

Masanori Sakai, Takaoka, JP;

Yukinao Kaga, Toyama, JP;

Takashi Yokogawa, Toyama, JP;

Tatsuyuki Saito, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); B08B 7/00 (2006.01); H01L 21/67 (2006.01); C23C 16/44 (2006.01); H01L 21/285 (2006.01);
U.S. Cl.
CPC ...
B08B 7/00 (2013.01); C23C 16/4404 (2013.01); C23C 16/4405 (2013.01); H01L 21/28562 (2013.01); H01L 21/67028 (2013.01);
Abstract

It is possible to efficiently remove deposited materials such as a conductive film or insulting film adhered to parts such as the inner wall of a processing chamber and a substrate supporting tool disposed in the processing chamber. There is provided a method of manufacturing a semiconductor device. The method comprises: loading a substrate into a processing chamber; forming a conductive film or an insulating film on the substrate by supplying a plurality of source gases into the processing chamber; unloading the substrate from the processing chamber; and modifying a conductive film or an insulating film adhered to the processing chamber by supplying a modifying gas into the processing chamber. After performing a cycle of the loading, the forming, the unloading, and the modifying processes a plurality of times, the modified conductive film or the modified insulating film adhered to the processing chamber is removed from the processing chamber by supplying a cleaning gas into the processing chamber.


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