The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Nov. 06, 2012
Applicant:

Caustic Graphics, Inc., San Francisco, CA (US);

Inventors:

Nur Monson, San Ramon, CA (US);

James Alexander McCombe, San Francisco, CA (US);

Sean Matthew Gies, San Francisco, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06F 11/3466 (2013.01); G06F 11/3409 (2013.01); G06F 11/3452 (2013.01); G06F 2201/865 (2013.01);
Abstract

A profiler for a ray tracing renderer interfaces with the renderer to collect rendering information, such as ray definition information, a pixel origin, objects hit, shader invocation, and related rays. In an interface, an artist views a simplified 3-D scene model and a rendered 2-D image. A pixel in the 2-D image is selectable; the profiler responds by populating the simplified 3-D scene with rays that contributed to that pixel. Rays can be displayed in the simplified 3-D scene to visually convey information about characteristics of each ray, such as whether the ray intersected an object, portions of the scene where it is occluded, and a direction. Statistics can be produced by the profiler that convey information such as relative computational complexity to render particular pixels. The profiler can step through multiple passes (e.g., multiple frames and passes of a multipass rendering), and the UI can allow pausing and stepping.


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