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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9235345 B1

PDFFull Text
Date of Patent:
Jan. 12, 2016

Filed:

Dec. 23, 2011

Method and system for controlling loss of reliability of non-volatile memory

Applicants:

Amedeo Veneroso, Caserta, IT;

Francesco Varone, Bellona, IT;

Pasquale Vastano, S. Maria Capua Vetere, IT;

Vitantonio Distasio, Caserta, IT;

Inventors:

Amedeo Veneroso, Caserta, IT;

Francesco Varone, Bellona, IT;

Pasquale Vastano, S. Maria Capua Vetere, IT;

Vitantonio Distasio, Caserta, IT;

Assignee:

STMICROELECTRONICS INTERNATIONAL N.V., Geneva, CH;

Attorney:

Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.

Primary Examiner:

Idriss N Alrobaye

Assistant Examiner:

Richard B Franklin

Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 13/00 (2006.01); G11C 29/00 (2006.01); G06F 3/06 (2006.01); G06F 11/00 (2006.01); G07F 7/08 (2006.01); G11C 29/50 (2006.01); G06F 12/02 (2006.01); G11C 16/04 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0614 (2013.01); G06F 11/008 (2013.01); G06F 12/0246 (2013.01); G07F 7/082 (2013.01); G11C 29/50 (2013.01); G11C 29/50016 (2013.01); G11C 16/04 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/5002 (2013.01);
Abstract

A method for controlling a loss of reliability of a non-volatile memory (NVM) included in an integrated circuit card (ICC) may include determining whether the NVM is reliable at the operating system (OS) side of the ICC, and generating an event associated with the reliability of the NVM at the OS side for an application of the ICC, if the NVM is determined to be unreliable.

Find Patent Forward Citations

Veneroso, Amedeo. (2016). Method and system for controlling loss of reliability of non-volatile memory (U.S. Patent No. 9235345). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9235345

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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