The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Aug. 23, 2011
Applicants:

Paul G. Gladnick, Seattle, WA (US);

Mark Delaney, Shoreline, WA (US);

Inventors:

Paul G. Gladnick, Seattle, WA (US);

Mark Delaney, Shoreline, WA (US);

Assignee:

MITUTOYO CORPORATION, Kanegawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); H04N 5/2354 (2013.01); G01N 2021/8838 (2013.01);
Abstract

The repeatability of strobe illumination for image exposure is improved over a wide dynamic range in a machine vision system wherein a relationship between a camera integration period and a pulse duration of a strobe light generator control the effective exposure of a camera image during a timing overlap between a beginning of the camera integration period and an end of the pulse duration. To avoid noise in the illumination, the illumination pulse duration may start, the camera integration period may begin after a delay relative to that start and not later than the end of the pulse duration, the pulse duration may end, and the camera integration period may end not earlier than the end of the pulse duration. The timing overlap may also be synchronized with a periodic ripple component in the strobe illumination, to provide improved repeatability.


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