The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Mar. 11, 2013
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Onur Canturk Hamsici, San Diego, CA (US);

John Hyunchul Hong, San Clemente, CA (US);

Chong Uk Lee, San Diego, CA (US);

Assignee:

QUALCOMM INCORPORATED, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01); G01J 3/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4652 (2013.01); G01J 3/46 (2013.01); G01J 3/462 (2013.01);
Abstract

Methods, devices, and computer program products for robust estimation of color-dependent measurements are described herein. In one aspect, a method for generating a reference color grid that may be placed beside a color-dependent measuring device is disclosed. The reference color grid may contain a number of colors which enable a mapping from the color space of a testing device to a reference color space. This mapping may allow a function that is able to determine an estimate of a color-dependent measurement based on a color in the reference color space to be used. In another aspect, a method for robust estimation of color-dependent measurement using a reference color guide is disclosed.


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