The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Mar. 15, 2013
Applicants:
Christopher Wilkerson, Portland, OR (US);
Jawad Nasrullah, Palo Alto, CA (US);
Kelvin Kwan, Santa Clara, CA (US);
Inventors:
Christopher Wilkerson, Portland, OR (US);
Jawad Nasrullah, Palo Alto, CA (US);
Kelvin Kwan, Santa Clara, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/08 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0891 (2013.01);
Abstract
A method is described that includes during runtime of a semiconductor die, determining that a next BIST test sequence of a storage component embedded on the die is appropriate. The method further includes applying a BIST test sequence to each valid entry in the storage component. The method also includes marking any newly invalid entries in the storage component as invalid and configuring a respective replacement entry for each of the newly invalid entries.