The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2016
Filed:
Jul. 01, 2013
Advantest Corporation, Tokyo, JP;
Yoshikazu Nakayama, Saitama, JP;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
To accurately measure a frequency characteristic of a waveform generating apparatus, provided is a measurement apparatus that measures a frequency characteristic of a waveform generating apparatus generating a signal having a waveform corresponding to waveform data, comprising a control section that causes a plurality of sine wave signals having different frequencies to be sequentially output from the waveform generating apparatus; a measuring section that measures each of the sine wave signals output from the waveform generating apparatus; and a calculating section that calculates a frequency characteristic of the waveform generating apparatus based on the measurement results of the measuring section. The control section causes trigger signals to be output from the waveform generating apparatus and causes the sine wave signals to be output in synchronization with the trigger signals, and the measuring section measures a phase of each sine wave signal with the corresponding trigger signal as a reference.