The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 2016

Filed:

Nov. 19, 2009
Applicants:

Qing LI, Hitachinaka, JP;

Tomonori Mimura, Kasama, JP;

Shinichi Fukuzono, Hitachinaka, JP;

Naomi Ishii, Mito, JP;

Inventors:

Qing Li, Hitachinaka, JP;

Tomonori Mimura, Kasama, JP;

Shinichi Fukuzono, Hitachinaka, JP;

Naomi Ishii, Mito, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01D 18/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00693 (2013.01); G01N 35/00613 (2013.01); G01D 18/00 (2013.01); G01N 35/00712 (2013.01); G01N 35/025 (2013.01); Y10T 436/10 (2015.01); Y10T 436/11 (2015.01);
Abstract

There is provided a comprehensive accuracy management method attained by including the steps of: displaying operation event information in time series in an accuracy management result chart or a calibration result chart on the same screen; accumulating a characteristic daily measurement value fluctuation pattern on the basis of a kind of an operation event; displaying the latest fluctuation pattern of measurement results and the daily measurement value fluctuation pattern in superposition with each other to warn of fluctuations which differ from the daily measurement value fluctuation pattern; and estimating and reporting the cause of the fluctuations.


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