The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Nov. 21, 2012
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kevin W. Gorman, Fairfax, VT (US);

Michael R. Ouellette, Westford, VT (US);

Patrick E. Perry, Shelburne, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/36 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 29/4401 (2013.01); G11C 29/12 (2013.01); G11C 29/36 (2013.01);
Abstract

Systems and methods are provided for reusing existing test structures and techniques used to test memory data to also test error correction code logic surrounding the memories. A method includes testing a memory of a computing system with an error code correction (ECC) logic block bypassed and a first data pattern applied. The method further includes testing the memory with the ECC logic block enabled and a second data pattern applied. The method also includes testing the memory with the ECC logic block enabled and the first data pattern applied.


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