The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Mar. 23, 2012
Hajime Sugimura, Saitama, JP;
Takeshi Yaguchi, Saitama, JP;
Takahiro Nakajima, Gunma, JP;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A test apparatus that tests a device under test, comprising a control apparatus sequentially executing a plurality of test programs and controlling testing of the device under test; and a test module controlled by the control apparatus to test the device under test by communicating with the device under test and to transmit a test result of each test program to the control apparatus. The test module includes memories that store the test results of the test programs, and starts a subsequent test such that at least a portion of a result processing time period of a current test, from when a test result stored in a first memory begins being transmitted to the control apparatus to when processing of the test result by the control apparatus ends, overlaps with at least a portion of a test execution period in which the subsequent test is executed using a second memory.