The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Mar. 13, 2013
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Ki Yoon, Sacramento, CA (US);
Robert De Gruijl, San Francisco, CA (US);
Chai Ziv, Jerusalem, IL;
Michael Klinglesmith, Portland, OR (US);
Assignee:
INTEL CORPORATION, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/26 (2006.01); G06F 11/273 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/26 (2013.01); G06F 11/2733 (2013.01); G06F 11/3636 (2013.01); G06F 11/3648 (2013.01);
Abstract
A fabric trace hook is disclosed to enable debugging operations of agents operating in a peer-to-peer integrated on-chip system fabric. The fabric trace hook, embedded within the IOSF, includes programmable triggering and capturing logic, timestamp capability, and a security feature to disallow tracing of proprietary transactions. The fabric trace hook may operate in a lossy or lossless mode.