The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2015
Filed:
Mar. 09, 2012
Yu Huang, Sudbury, MA (US);
Wu-tung Cheng, Lake Oswego, OR (US);
Ruifeng Guo, Portland, OR (US);
Manish Sharma, Wilsonville, OR (US);
Liyang Lai, Wilsonville, OR (US);
Yu Huang, Sudbury, MA (US);
Wu-Tung Cheng, Lake Oswego, OR (US);
Ruifeng Guo, Portland, OR (US);
Manish Sharma, Wilsonville, OR (US);
Liyang Lai, Wilsonville, OR (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Aspects of the invention relate to techniques of using two-dimensional scan architecture for testing and diagnosis. A two-dimensional scan cell network may be constructed by coupling input for each scan cell to outputs for two or more other scan cells and/or primary inputs through a multiplexer. To test and diagnose the two-dimensional scan cell network, the two-dimensional scan cell network may be loaded with chain patterns and unloaded with corresponding chain test data along two or more sets of scan paths. Based on the chain test data, one or more defective scan cells or defective scan cell candidates may be determined.