The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Mar. 13, 2013
The Chinese University of Hong Kong, Shatin, New Territories, HK;
Yuk Ming Dennis Lo, Kowloon, HK;
Wai Kwun Rossa Chiu, Shatin, HK;
Kwan Chee Chan, Kowloon, HK;
Wenli Zheng, Shatin, HK;
Hao Sun, Shatin, HK;
Zhang Chen, Philadelphia, PA (US);
The Chinese University of Hong Kong, Shatin, CN;
Abstract
This invention provides several ways of managing GC bias that occurs during seequencing and analysis of genomic DNA. Maternal plasma can be used as a source of fetal DNA for analysis. DNA segments or tags obtained from the plasma can be aligned with a chromosomal region of interest and with an artificial reference chromosome assembled from regions of the genome having matching GC content. This technology can be used, for example, to detect and evaluate aneuploidy and other chromosomal abnormalities.