The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 2015

Filed:

Mar. 21, 2014
Applicant:

Lsi Corporation, San Jose, CA (US);

Inventors:

Chaitanya Palusa, Fremont, CA (US);

Adam B. Healey, Newburyport, MA (US);

Hiep T. Pham, San Jose, CA (US);

Volodymyr Shvydun, Los Altos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/03 (2006.01); H03M 1/00 (2006.01); H04L 1/06 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03057 (2013.01); H03M 1/00 (2013.01); H03H 2218/06 (2013.01); H03M 2201/4135 (2013.01); H04L 1/06 (2013.01);
Abstract

A multi-stage system and method for correcting intersymbol interference is disclosed. The system includes a first estimation module configured to sample an input signal to produce a first set of estimated data bits. The system also includes a second estimation module configured to sample the input signal phase shifted by a predetermined phase shift unit to produce a second set of estimated data bits, wherein the second set of estimated data bits are produced at least partially based on the first set of estimated data bits and at least one pre-cursor coefficient.


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