The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2015
Filed:
Jul. 26, 2012
Paolo E. Mangalindan, Rancho Cordova, CA (US);
Alberto Troia, Carlentini, IT;
Yihua Zhang, Folsom, CA (US);
Poorna Kale, Folsom, CA (US);
Paolo E. Mangalindan, Rancho Cordova, CA (US);
Alberto Troia, Carlentini, IT;
Yihua Zhang, Folsom, CA (US);
Poorna Kale, Folsom, CA (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Methods and apparatuses for calibrating data sampling points are disclosed herein. An example apparatus may include a memory that may be configured to receive a calibration command and an attribute. The memory may include a first register that is configured to store a tuning data pattern and a second register that is configured to receive and store the tuning data pattern stored in the first register. The second register may be further configured to store the tuning data pattern responsive, at least in part, to the memory receiving the calibration command. The memory may be configured to execute an operation on at least one of the tuning data pattern stored in the first register or the tuning data pattern stored in the second register based, at least in part, on the attribute.