The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Sep. 27, 2012
Applicant:

Parade Technologies, Ltd., Santa Clara, CA (US);

Inventors:

Andriy Maharyta, Lviv, UA;

Ihor Musijchuk, Lviv, UA;

Assignee:

PARADE TECHNOLOGIES, LTD., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); H03K 17/955 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
H03K 17/955 (2013.01); G06F 3/044 (2013.01); G06F 3/0416 (2013.01); G06F 3/0418 (2013.01); H03K 2217/960705 (2013.01); H03K 2217/960775 (2013.01);
Abstract

Apparatuses and methods of frequency selection algorithms and frequency set selection are described. One method monitors a signal on the electrodes of a sense network, determine a first group of noise metrics of noise in the signal, determine a second group of noise metrics. The method switches from a first operating frequency in a first set to a second operating frequency in the first frequency set based on the first group of noise metrics and switches from the first operating frequency in the first set to a third operating frequency in a second frequency set based on the second group of noise metrics.


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