The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Apr. 23, 2012
Applicants:

Kozo Ariga, Tokyo, JP;

Masaru Kawazoe, Yamato, JP;

Inventors:

Kozo Ariga, Tokyo, JP;

Masaru Kawazoe, Yamato, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/42 (2006.01);
U.S. Cl.
CPC ...
G01N 3/42 (2013.01); G01N 2203/0078 (2013.01);
Abstract

A hardness tester that measures a size of an indent to determine the hardness of a sample. The hardness tester includes an imaging unit, a display unit, a pointing device and a position adjustment unit. The imaging unit takes an image of a surface of the sample. The display unit displays a surface image of the sample and a cursor. The pointing device receives a first instruction instructing a movement of the surface image of the sample appearing on the display unit through a movement of the cursor, and a second instruction instructing a change in a height of the sample stage through a movement of the cursor. The position adjustment unit moves the sample stage in a horizontal direction and in a vertical direction.


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