The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Mar. 13, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Albert M. Chu, Nashua, NH (US);

Nazmul Habib, Colchester, VT (US);

Daryl M. Seitzer, South Burlington, VT (US);

Rohit Shetty, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); G11C 11/417 (2006.01);
U.S. Cl.
CPC ...
G11C 11/417 (2013.01);
Abstract

Various embodiments include solutions for generating a physically unclonable function. In some cases, a method includes an electronic circuit including: a static random access memory (SRAM) device having at least one memory cell with at least one transistor device therein, SRAM bias temperature instability aging circuitry coupled with the SRAM device and configured to apply aging conditions to the at least one memory cell to degrade the at least one transistor device within the at least one memory cell, and at least one computing device coupled with the SRAM device and configured to: skew a storage cell value in the at least one transistor device, measure a skewed value of the storage cell after the skewing, and create a physically unclonable function from the skewed value of the storage cell.


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