The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2015

Filed:

Jul. 14, 2014
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Yantao Ma, Boise, ID (US);

Aaron Willey, Burlington, VT (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 11/26 (2006.01); G11C 7/22 (2006.01); H03K 5/156 (2006.01); H03L 7/081 (2006.01); H03K 5/13 (2014.01);
U.S. Cl.
CPC ...
G11C 7/22 (2013.01); G11C 7/222 (2013.01); G11C 7/225 (2013.01); H03H 11/265 (2013.01); H03K 5/133 (2013.01); H03K 5/1565 (2013.01); H03L 7/0812 (2013.01);
Abstract

Examples of circuits and methods for compensating for power supply induced signal jitter in path elements sensitive to power supply variation. An example includes a signal path coupling an input to an output, the signal path including a delay element having a first delay and a bias-controlled delay element having a second delay. The first delay of the delay element exhibits a first response to changes in power applied thereto and the second delay of the bias-controlled delay element exhibits a second response to changes in the power applied such that the second response compensates at least in part for the first response.


Find Patent Forward Citations

Loading…