The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Mar. 27, 2012
Applicants:
Hajime Sugimura, Saitama, JP;
Takeshi Yaguchi, Saitama, JP;
Takahiro Nakajima, Gunma, JP;
Inventors:
Assignee:
ADVANTEST CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G06F 11/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 11/26 (2013.01);
Abstract
Provided is a test apparatus that tests a device under test, comprising a test module that communicates with the device under test to test the device under test; and a control apparatus that executes a plurality of test programs, causes the test module to perform tests corresponding respectively to the test programs, receives test results from the test module, and performs predetermined result processes on the test results. The control apparatus stores an execution order of the test programs, and executes at least a portion of the result processes in an order indicated by the stored execution order.