The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Mar. 08, 2013
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Richard Mellitz, Prosperity, SC (US);

Adee Ran, Maayan Baruch, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/32 (2006.01); H04B 3/46 (2015.01); H04B 3/487 (2015.01);
U.S. Cl.
CPC ...
H04B 3/46 (2013.01); H04B 3/487 (2015.01);
Abstract

One embodiment provides a network device that includes PHY circuitry comprising transmit circuitry (Tx) and receive circuitry (Rx), wherein the Tx and Rx circuitry are configured to be coupled to a respective channel to communicate with an external device via the channels, wherein the network device configured to communicate with the external device using an Ethernet communications protocol; and test circuitry. The test circuitry is configured to: designate a through channel and at least one crosstalk channel from among the channels; determine, in the time domain, an approximate available signal voltage of a first response signal, wherein the first response signal is in response to a test signal applied to the through channel; determine a first noise profile of the first response signal in response to the test signal applied on the through channel; determine a second noise profile of a second response signal, wherein the second response signal is in response to the test signal applied on a crosstalk channel and measured on the through channel; and determine a signal-to-noise ratio of the through channel based on, at least in part, the approximate available signal voltage and the first and second noise profiles.


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