The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Dec. 12, 2014
Applicant:
Keithley Instruments, Inc., Cleveland, OH (US);
Inventors:
Wayne C. Goeke, Hudson, OH (US);
Brian P. Frackelton, Macedonia, OH (US);
Benjamin J. Yurick, Garrettsville, OH (US);
Assignee:
TEKTRONIX, INC., Beaverton, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01); H03M 1/12 (2006.01); H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1245 (2013.01); H03M 1/0634 (2013.01); G01R 13/0254 (2013.01); G01R 13/0272 (2013.01);
Abstract
A method for producing sampled data, which as the requested sampling period is increased, each sample is the average of an increasing number of ADC samples such that a maximum number of ADC samples are evenly space across the sample period. The method can include choosing one of multiple ADC with varying speed versus resolution capabilities to further increase the quality of the sampled data as the sampling period increases.