The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Oct. 08, 2014
Applicant:
Jeol Ltd., Tokyo, JP;
Inventor:
Hirofumi Iijima, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/21 (2006.01); H01J 37/22 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/21 (2013.01); H01J 37/226 (2013.01); H01J 37/26 (2013.01); H01J 37/263 (2013.01); H01J 37/265 (2013.01); H01J 2237/0492 (2013.01); H01J 2237/10 (2013.01); H01J 2237/1534 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/21 (2013.01); H01J 2237/2602 (2013.01); H01J 2237/2614 (2013.01);
Abstract
An image acquisition method and system for use in transmission electron microscopy and capable of providing information about a wide range of frequency range. The method is initiated with setting at least one of the spherical aberration coefficient and chromatic aberration coefficient of the imaging system of the microscope to suppress attenuation of a contrast transfer function due to an envelope function. Then, an image is obtained by the imaging system placed in defocus conditions.