The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Mar. 29, 2012
Applicants:

Debaleena Das, Los Gatos, CA (US);

Rajat Agarwal, Beaverton, OR (US);

C. Scott Huddleston, Beaverton, OR (US);

Inventors:

Debaleena Das, Los Gatos, CA (US);

Rajat Agarwal, Beaverton, OR (US);

C. Scott Huddleston, Beaverton, OR (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/16 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1666 (2013.01); G06F 11/1064 (2013.01);
Abstract

A novel ECC scheme is disclosed that offers an error protection level that is at least the same as (if not better than) that of the conventional ECC scheme without negatively impacting latency and design complexity. Embodiments of the present disclosure utilize an ECC scheme which leaves up to extra 2B for metadata storage by changing the error detection and correction process flow. The scheme adopts an early error detection mechanism, and tailors the need for subsequent error correction based on the results of the early detection.


Find Patent Forward Citations

Loading…