The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Sep. 26, 2012
Applicant:

Korea Institute of Machinery & Materials, Daejeon, KR;

Inventors:

Byung-Oh Choi, Daejeon, KR;

Byung-Soon Ryoo, Daejeon, KR;

Kyu Jin Lim, Daejeon, KR;

Dong-Soo Kim, Daejeon, KR;

Jeong Dai Jo, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41F 13/14 (2006.01); B41J 29/38 (2006.01); B41F 33/00 (2006.01); B41F 9/01 (2006.01);
U.S. Cl.
CPC ...
B41F 13/14 (2013.01); B41F 9/01 (2013.01); B41F 33/0081 (2013.01);
Abstract

The present invention relates to a precision overprinting method of printed electronics rotary printing where a location can be adjusted in real time. More particularly, minute precise printing electronic patterns of a micrometer level which are multilayered by a plurality of gravure offset printing units are accurately overprinted, and a fine deviation in a rotation direction and an axial direction of a plate cylinder is quickly solved. The present invention also relates to a precision overprinting method of printed electronics rotary printing where a location can be adjusted in real time, capable of verifying a printing quality by displaying register marks printed in printing units and alignment state on a display device.


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