The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Sep. 24, 2012
Shiro Hino, Tokyo, JP;
Naruhisa Miura, Tokyo, JP;
Akihiko Furukawa, Tokyo, JP;
Tomokatsu Watanabe, Tokyo, JP;
Kenichi Ohtsuka, Tokyo, JP;
Hiroshi Watanabe, Tokyo, JP;
Yuji Ebiike, Tokyo, JP;
Shiro Hino, Tokyo, JP;
Naruhisa Miura, Tokyo, JP;
Akihiko Furukawa, Tokyo, JP;
Tomokatsu Watanabe, Tokyo, JP;
Kenichi Ohtsuka, Tokyo, JP;
Hiroshi Watanabe, Tokyo, JP;
Yuji Ebiike, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
A semiconductor device that can improve reliability while suppressing increase of a conduction loss or a switching loss. In the semiconductor device, when a two-dimensional shape on a main surface of the semiconductor substrate is an unit cell, the shape being a repeating unit of a plurality of well regions periodically disposed in a surface layer of a drift layer, one unit cell and another unit cell adjacent in an x-axis direction are disposed misaligned in a y-axis direction, and one unit cell and another unit cell adjacent in the y-axis direction are disposed misaligned in the x-axis direction.