The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Dec. 04, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kai Di Feng, Hopewell Junction, NY (US);

Wai-Kin Li, Hopewell Junction, NY (US);

Chengwen Pei, Hopewell Junction, NY (US);

Ping-Chuan Wang, Hopewell Junction, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/71 (2013.01); G06F 7/58 (2006.01);
U.S. Cl.
CPC ...
G06F 21/71 (2013.01); G06F 7/588 (2013.01);
Abstract

A set of physical unclonable function (PUF) cells is configured with a set of capacitive devices in an integrated circuit (IC). A subset of PUF cells includes a corresponding subset of capacitive devices that have failed during fabrication. A charging current sufficient to charge an operational capacitive device in a PUF cell is sent to the set of PUF cells. A determination is made whether an output voltage of a PUF cell exceeds a threshold. When the output voltage exceeding the threshold, a logic value of 1 is produced at a position in a bit-string. The determination and the producing is repeated for each PUF cell in the set to output a bit-string, which includes 1s and 0s in random positions. The bit-string is used in a security application as a random stable value owing to a random pattern of 1s and 0s present in the bit-string.


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