The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Mar. 26, 2014
Jeol Ltd., Tokyo, JP;
Genki Kinugasa, Tokyo, JP;
JEOL Ltd., Tokyo, JP;
Abstract
An X-ray spectrometer () capable of reducing the effects of noises includes: an X-ray detector () outputting a staircase waveform (S); a first differential filter () converting the staircase waveform (S) into a first pulsed signal (S); an event detection portion () detecting whether the first pulsed signal (S) has exceeded a threshold value; a noise event detection portion () determining whether the first pulsed signal (S) in excess of the threshold value is shorter than a given time; a second differential filter () converting the staircase waveform (S) into a second pulsed signal (S) having peaks whose heights correspond to the heights of the steps of the staircase waveform; a maximum value detection portion () detecting pulsed signal (S) if the first pulsed signal (S) exceeds a threshold value; and a decision portion () making a decision based on the noise event detection portion ().