The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Jun. 20, 2012
Shun Kumano, Kokubunji, JP;
Masuyuki Sugiyama, Hino, JP;
Yuichiro Hashimoto, Tachikawa, JP;
Hideki Hasegawa, Tachikawa, JP;
Masuyoshi Yamada, Ichikawa, JP;
Hidetoshi Morokuma, Hitachinaka, JP;
Shuhei Hashiba, Wako, JP;
Shun Kumano, Kokubunji, JP;
Masuyuki Sugiyama, Hino, JP;
Yuichiro Hashimoto, Tachikawa, JP;
Hideki Hasegawa, Tachikawa, JP;
Masuyoshi Yamada, Ichikawa, JP;
Hidetoshi Morokuma, Hitachinaka, JP;
Shuhei Hashiba, Wako, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Abstract
A mass spectrometer including a sample attaching member of attaching a sample, an ionizing chamber including an introductory port of the sample attaching member and an ionization source of generating a sample ion, a vacuumed chamber having a mass analyzer of analyzing the sample ion, and an opening/closing mechanism provided between the ionizing chamber and the vacuumed chamber, in which the opening/closing mechanism is controlled from a closed state to an open state after introducing the sample attaching member into the ionizing chamber to thereby enable to perform ionization with inconsiderable fragmentation at a high sensitivity with a high throughput.