The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

May. 09, 2013
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

John I. Woodfill, Palo Alto, CA (US);

Etienne G. Grossmann, Redwood City, CA (US);

Gaile Gordon, Palo Alto, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/00 (2006.01); G06K 9/00 (2006.01); H04N 13/02 (2006.01); G06T 1/20 (2006.01); H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6202 (2013.01); G06K 9/00201 (2013.01); G06T 1/20 (2013.01); G06T 7/0075 (2013.01); H04N 13/0203 (2013.01); H04N 2013/0081 (2013.01);
Abstract

Systems and methods to determine a disparity map using row causal scanline optimization stereo matching are presented. A method includes, for each corresponding pixel P between a pair of input stereo images, and for each considered disparity, determining a basic match cost and a match cost for each of a set of given orientations including an east orientation and one or more other orientations, determining an overall match cost for each pixel at each considered disparity based on a sum of the determined match costs for all considered orientations for each pixel and disparity pair, and determining a resulting disparity for each pixel based on a minimum of the determined overall match costs, where a subset of the determined resulting disparities becomes available prior to completion of the input images being read in, and where the resulting disparities for all pixels are determined in a single pass through the input images.


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