The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Jul. 26, 2012
Bradley R. Quinton, Vancouver, CA;
Andrew M. Hughes, Vancouver, CA;
Steven J. E. Wilton, Vancouver, CA;
Bradley R. Quinton, Vancouver, CA;
Andrew M. Hughes, Vancouver, CA;
Steven J. E. Wilton, Vancouver, CA;
TEKTRONIX, INC., Beaverton, OR (US);
Abstract
Test and measurement instrumentation collects time information independently in each clock domain using a device that monotonically changes state with the passage of time according to a local clock domain. The device under test therefore has a unique state for each synchronous time period. The instrumentation periodically samples the devices under test, collects the state of each device, and records the state of the devices in conjunction with any data collected in clock domains that are synchronous with the devices. The periodic samples are transformed into numeric values using an isomorphic or linear model. These values are then fitted to an assumed frequency model that relates the state of devices in otherwise unrelated clock domains.