The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

May. 13, 2010
Applicants:

John F. Turpin, Tigard, OR (US);

Kathryn A. Engholm, Portland, OR (US);

Inventors:

John F. Turpin, Tigard, OR (US);

Kathryn A. Engholm, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0254 (2013.01); G01R 13/029 (2013.01);
Abstract

A test and measurement instrument processes digital data that represents an input signal to produce a target image, and then uses a computer vision technique to recognize a signal depicted within the target image. In some embodiments, the location of the signal within the target image is identified on a display device. In other embodiments, the location of the signal within the target image is used to perform a measurement. In other embodiments, when the signal is recognized, a trigger signal is generated that causes digital data that represents the input signal to be stored in a memory.


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