The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Aug. 28, 2009
Applicants:

Toshihide Orihashi, Hitachinaka, JP;

Masaki Takano, Tokyo, JP;

Mariko Miyaki, Tokyo, JP;

Tatsuya Tokunaga, Tokyo, JP;

Inventors:

Toshihide Orihashi, Hitachinaka, JP;

Masaki Takano, Tokyo, JP;

Mariko Miyaki, Tokyo, JP;

Tatsuya Tokunaga, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00722 (2013.01); G01N 2035/0091 (2013.01);
Abstract

A display is provided for an automatic analyzer to display statistics such as measurement results. A width of a display in a window that displays statistics may be adjusted and the amount of information to be displayed on the display is changed according to a level of detail of the information which the operator wants to confirm. Sample information, measurement results, and detailed information related to the measurement results are simultaneously displayed without a subwindow being displayed in overlapped form in the limited display area.


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