The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2015
Filed:
Aug. 26, 2013
Otsuka Electronics Co., Ltd., Hirakata-shi, JP;
Otsuka Electronics Co., Ltd., Hirakata-shi, JP;
Abstract
A spectral characteristic measurement apparatus includes a spectrometer for spatially dispersing incident light depending on wavelengths and a detection portion for receiving light dispersed by the spectrometer. The detection portion includes a first detection area on which a component in a first wavelength range is incident and a second detection area on which a component in a second wavelength range is incident. The apparatus includes a correction portion for correcting stray light detected by the detection portion derived from light to be measured. The correction portion corrects a stray light pattern based on a first amount of change with respect to wavelengths in the first wavelength range of the stray light pattern and a second amount of change with respect to wavelengths included in a result of detection in the first detection area of the detection portion, to calculate a stray light component derived from the light to be measured.