The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2015

Filed:

Sep. 12, 2013
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Shyh-An Chi, Hsinchu, TW;

Shiue Tsong Shen, Tuku Township, TW;

Jyy Anne Lee, Taipei, TW;

Yun-Han Lee, Baoshan Township, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05F 3/08 (2006.01); H03K 17/14 (2006.01); G05F 3/20 (2006.01); H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
G05F 3/205 (2013.01); H03K 19/00384 (2013.01);
Abstract

An integrated circuit includes a process voltage temperature (PVT) effect transducer responsive to a PVT effect, a PVT effect quantifier coupled to the PVT effect transducer and configured to quantify the PVT effect to provide an output, and a bias controller configured to receive the output of the PVT effect quantifier and provide a bias voltage for a substrate of an NMOS or a PMOS transistor. The bias controller is configured to compare the output received from the PVT effect quantifier to a threshold value, and decrease or increase the bias voltage depending on whether the output is higher or lower than the threshold value.


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