The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Apr. 12, 2013
Industrial Technology Research Institute, Hsinchu, TW;
Chih-Ming Shen, New Taipei, TW;
Guo-Shing Huang, Hsinchu County, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A testing method of bending stress and a testing apparatus thereof are provided. The method includes the following steps. A stress distribution model of a structure to be tested is built. Next, a testing sample of the structure to be tested is provided, and a force is applied on two ends of the testing sample to bend the testing sample till it breaks at a breaking point, so as to obtain a first distance between the two ends of the testing sample when the testing sample breaks, or a second distance from the breaking point to a closer end of the two ends. Next, a maximum principle stress value of the stress distribution model or a break point principle stress value at the breaking point of the stress distribution model is obtained according to the first distance or the second distance.