The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Jun. 19, 2013
Applicant:

Unitest Inc, Yongin-si, Gyeonggi-do, KR;

Inventors:

Eui Won Lee, Seongnam-si, KR;

Hyo Jin Oh, Yongin-si, KR;

Assignee:

UNITEST INC, Yongin-si, Gyeonggi-do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/10 (2006.01); G06F 11/22 (2006.01); G11C 29/54 (2006.01); G11C 29/56 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G06F 11/2221 (2013.01); G11C 29/54 (2013.01); G11C 29/56008 (2013.01); G11C 2029/0401 (2013.01); G11C 2029/5602 (2013.01); G11C 2029/5606 (2013.01);
Abstract

Disclosed is an error generating apparatus of a solid state drive tester. The error processing operation of the storage is tested by inserting errors into a specific instruction to be transmitted to the storage, and detecting the results of the error processing operation of the storage when testing the storage. The error generating apparatus includes a host terminal for receiving a test condition for a test of a storage from a user, and a test control unit for generating a test pattern according to the test condition or generating a test pattern randomly, generating error data used to test an error characteristic of the storage, and testing the storage based on the test pattern and a normal instruction or an error instruction which is formed by inserting the error data into the normal instruction.


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