The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Aug. 15, 2011
Applicants:

Robert Otillar, Los Altos, CA (US);

David Storek, Gothenburg, SE;

Christer Johansson, Gothenburg, SE;

Inventors:

Robert Otillar, Los Altos, CA (US);

David Storek, Gothenburg, SE;

Christer Johansson, Gothenburg, SE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G11C 7/10 (2006.01); B01J 19/00 (2006.01); B01L 3/00 (2006.01); G01N 27/74 (2006.01); G06F 7/72 (2006.01); G01N 35/00 (2006.01); C40B 40/06 (2006.01); C40B 60/14 (2006.01);
U.S. Cl.
CPC ...
G11C 7/1066 (2013.01); B01J 19/0046 (2013.01); B01L 3/502738 (2013.01); B01L 3/502761 (2013.01); G01N 27/745 (2013.01); G06F 7/723 (2013.01); B01J 2219/005 (2013.01); B01J 2219/0034 (2013.01); B01J 2219/00317 (2013.01); B01J 2219/00439 (2013.01); B01J 2219/00459 (2013.01); B01J 2219/00585 (2013.01); B01J 2219/00596 (2013.01); B01J 2219/00605 (2013.01); B01J 2219/00612 (2013.01); B01J 2219/00648 (2013.01); B01J 2219/00659 (2013.01); B01J 2219/00722 (2013.01); B01L 2300/049 (2013.01); B01L 2400/0633 (2013.01); C40B 40/06 (2013.01); C40B 60/14 (2013.01); G01N 35/0098 (2013.01); G01N 2035/00247 (2013.01); G01N 2035/00574 (2013.01); Y10T 436/25 (2015.01);
Abstract

Chips that include one or more particle manipulation mechanisms, or force transduction elements, provided at specific locations to manipulate and localize particles proximal the substrate surface. In one embodiment, individually addressable magnetic control mechanisms such as electric coils are provided at specific locations to create a magnetic field to attract magnetic particles, such a magnetic or magnetizable beads, to those specific locations. In another embodiment, electrostatic control mechanisms such as electrodes are provided to attract and manipulate electrically charged micro-particles. A location may include a crater or well formed in the substrate, or it may include an element on the surface of the substrate. In some embodiments, one or more sensors are located proximal specific locations, e.g., specific craters, so as to analyze specific conditions at each location. In other embodiments, multiple locations share one or more sensors.


Find Patent Forward Citations

Loading…