The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Aug. 06, 2014
Applicant:

Ltx-credence Corporation, Norwood, MA (US);

Inventor:

Richard Liggiero, Tewksbury, MA (US);

Assignee:

Xcerra Corporation, Boston, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01); G06F 17/50 (2006.01); G01R 27/28 (2006.01); H03H 7/065 (2006.01); H03H 11/12 (2006.01); H03M 1/00 (2006.01); H03H 11/04 (2006.01); H03H 11/32 (2006.01); H03H 7/01 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G01R 27/28 (2013.01); G06F 17/5036 (2013.01); H03H 7/065 (2013.01); H03H 11/1295 (2013.01); H03M 1/00 (2013.01); H03H 11/32 (2013.01); H03H 2007/013 (2013.01); H03H 2011/0488 (2013.01);
Abstract

A method, computer program product, and computer system for determining a magnitude and phase of a spurious-free dynamic range component. A first signal and a second signal may be received from a first source operatively connected to a differential component. A first output associated with the first signal and a second output associated with the second signal may be nulled. The first signal and the second signal may be shorted. A second source operatively connected to the differential component may be disconnected. The first signal of the first source may be applied at a same phase as the second source with an additional phase delta, +Y. A first differential residual signal may be measured using the first signal at the same phase as the second source with the additional phase delta, +Y. The second signal of the first source may be applied at the same phase as the second source with an additional phase delta, −Y. A second differential residual signal may be measured using the second signal at the same phase as the second source with the additional phase delta, −Y. The magnitude and phase of the distortion component of the first source may be determined based upon, at least in part, the first and second differential residual signal.


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