The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Nov. 26, 2013
Applicant:
Pacific Metrics Corporation, Monterey, CA (US);
Inventors:
Susan M. Lottridge, Monterey, CA (US);
Howard C. Mitzel, Seaside, CA (US);
John A. Pennington, Monterey, CA (US);
Assignee:
Pacific Metrics Corporation, Monterey, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/00 (2006.01); G06Q 50/20 (2012.01); G09B 7/00 (2006.01); G06F 17/27 (2006.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06F 17/2765 (2013.01); G06N 5/003 (2013.01); G06Q 10/10 (2013.01); G06Q 50/20 (2013.01); G09B 7/00 (2013.01);
Abstract
A system, method, and computer-readable medium for detecting plagiarism in a set of constructed responses by accessing and pre-processing the set of constructed responses to facilitate the pairing and comparing of the constructed responses. The similarity value generated from the comparison of a pair of constructed responses serves as an indicator of possible plagiarism.